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VIEW
Innovation is the hallmark of technology, but it's in the
application of ideas where the real value lies. Back in 1976, View's
founders conceived a device that could measure by seeing instead of
touching, ushering in a new era in measurement-automatic, non-contact
metrology. Our current products are the embodiment of this
now-mature concept, the culmination of over 25 years of design innovation
and applications experience. With the longest track record in the
industry, View offers the breadth of experience to solve even the most
challenging measurement applications. And our enduring commitment to
providing the industry's most complete solutions, and you'll understand
why most View customers are repeat customers.
Our Pinnacle and Summit systems are the finest precision vision
measurement systems available from any manufacturer, providing rapid,
ultra-precise assessment of critical dimensions in components and
assemblies. But that's not all. These systems are integral to
the production process, providing monitoring and control feedback for
real-time adjustments to manufacturing equipment. This enables
manufacturers to control their processes, resulting in reduced equipment
downtime and lowering manufacturing costs, as well as leading to improved
productivity and profitability.
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 High
performance in a benchtop metrology system
Featuring:
U2 (XY plane) = (2.0 +
L/250) um
0.1 µm resolution
Dual Magnification
Optical System
Multi-sensor camera and
through-the-lens laser probe capability
Powerful Windows 2000
-based View Metrology Software (VMS)
Customizable operator
interface
Exclusive edge detection
algorithms optimized for speed, accuracy and robustness
Subpixel accuracy
of 1/10 to 1/50 pixel
VIEW
PINNACLE
Pinnacle of performance
The View Pinnacle represents the culmination of View's long tradition of
delivering exceptional productivity in precision measurement platforms.
The system is designed for dimensional measuring applications requiring
the highest levels of accuracy, throughput, functionality and
reliability. Design features include a precision granite base and
column, passive vibration isolation system, linear motors - with
exceptional acceleration and velocity performance - and non-contact
stage encoders offering very high resolution. This combination of
attributes and small footprint make the View Pinnacle an ideal choice
for product design and development and near-line process monitoring
applications in advanced manufacturing environments.
 VIEW
SUMMIT
Size without compromise
Featuring a fixed bridge design with a
heavy-duty granite base and arch, and sharing the same core performance
technologies as the View Pinnacle, the View Summit provides high
accuracy and measuring speeds for near-line process monitoring and
quality assurance applications.* Available in a variety of
large-travel stage sizes, the system is ideally suited for measuring
large footprint parts such as PCBs, stencils, flat panel displays,
etching sheets and mask patterns, as well as nested groups of smaller
parts.
* Refer to the Pinnacle and Summit
Technical Data Sheets for detailed specifications.
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